Collect. Czech. Chem. Commun. 1979, 44, 3434-3440
https://doi.org/10.1135/cccc19793434

FEM and FIM study of the work function of stepped metal surfaces

Zlatko Knor

J. Heyrovský Institute of Physical Chemistry and Electrochemistry, Czechoslovak Academy of Sciences, 121 38 Prague 2

Abstract

A comparison between FEM and FIM images of the tungsten surface shows that stepped (high-index) planes influence emitted electrons in two ways; a) if monoatomic steps whose edges form the crystal face under question are wider than about three atoms, the surface behaves as a patchy surface formed by flat areas of the steps; b) if steps are narrower than the above mentioned limit, the emitted electrons feel the field of the crystal plane determined by step edges (the work function acquires low values corresponding to atomically rough surface).