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https://doi.org/10.1135/cccc19970199
X-Ray Photoelectron Spectroscopic (XPS) Studies of Clean and Ion Beam Bombarded Sb2Te2Se and (Bi0.7Sb0.3)2Se3.0(111) Surfaces
Zdeněk Bastl, Ilona Spirovová and Michaela Janovská
J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, 182 23 Prague 8, Czech Republic
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